The SPAR 2010 Conference kicked off last evening with some in-depth workshops and a Super Bowl reception. The program for this year’s event mixes a number of focus areas for technological advancement along with breakout sessions for key technology applications. In this hot technology area there’s a lot of buzz about improved workflows, and with this year’s event there’s a focus on key areas of opportunity.

Among the key application areas outlined with multi-day sessions are Mobile Surveying, Industrial Plant, Security Planning & Forensic and Scan to BIM. The diversity in application areas are supplemented with some interesting sessions on the cutting edge of technology advancement.

Stay tuned for more details from this event.

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